ON-SITE RAPID SCREENING FOR SUGARCANE SMUT RESISTANCE USING NEAR-INFRARED (NIR) SPECTROSCOPY

THIS PAPER describes the process developed for a rapid, non-destructive, on-site screening technique based on NIR spectroscopy for rating the resistance of sugarcane clones to sugarcane smut. Upon implementation, this technique will allow the screening of larger plant populations at earlier stages within the selection program, thereby realising considerable gains in efficiency and a significant retention of genetic variability. Thirty one blind sugarcane samples were selected for a validation trial conducted in Bundaberg during the 2009 season. The NIR spectra of stalk bud tissue were collected, pretreated and submitted for chemometric analysis. The NIR-predicted smut ratings were compared to the traditionally derived field trial values, with very encouraging results for the development of an early screening tool.